{"id":41756,"date":"2022-01-03T18:41:18","date_gmt":"2022-01-03T17:41:18","guid":{"rendered":"https:\/\/www.trioptics.fr\/?post_type=product&p=41756"},"modified":"2025-08-27T14:00:16","modified_gmt":"2025-08-27T12:00:16","slug":"accufiz-d-short-coherence-interferometer","status":"publish","type":"product","link":"https:\/\/www.trioptics.fr\/en\/product\/accufiz-d-short-coherence-interferometer\/","title":{"rendered":"AccuFiz D Short Coherence interferometer"},"content":{"rendered":"
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Measuring thin and transparent optics is an extremely difficult application. The reflections of the two close surfaces create a complex fringing pattern that is difficult, if not impossible, to measure.<\/span>\u00a0<\/span><\/p>\n

The AccuFiz D short-coherence dynamic Fizeau interferometer<\/strong> can measure flat and curved transparent optics with high accuracy. Thanks to its short consistency source, you can measure flat and parallel surfaces less than 0.2 mm apart without having to apply a coating to eliminate unwanted fringing. A fast and automated internal system allows you to scan quickly to locate and isolate each surface.<\/span>\u00a0<\/span><\/p>\n

Specifications:<\/span>\u00a0<\/span><\/p>\n\n\n\n\n\n\n\n\n\n\n\n\n
Configuration<\/span><\/td>\nFizeau Interferometer<\/span><\/span><\/strong><\/td>\n<\/tr>\n
Acquisition<\/span><\/td>\nPatented Dynamic Interferometry\u00ae<\/span><\/span><\/td>\n<\/tr>\n
Source<\/span><\/td>\nExternal source short coherence (~200<\/span><\/span>\u03bc<\/span><\/span>m)<\/span><\/span>\u00a0<\/span><\/td>\n<\/tr>\n
Wavelength <\/span><\/span><\/td>\n636nm<\/td>\n<\/tr>\n
Opening <\/span><\/span><\/td>\n100mm ; 600mm optional<\/span><\/span><\/td>\n<\/tr>\n
Camera<\/span><\/td>\n4MP, 12-bit<\/td>\n<\/tr>\n
Controls <\/span><\/span><\/td>\nTouch screen device<\/span><\/span><\/td>\n<\/tr>\n
Zoom<\/span><\/td>\nContinuous zoom <\/span><\/span>1-10X<\/td>\n<\/tr>\n
Software <\/span><\/span><\/td>\n4Sight\u2122 Focus Analysis Software (included)<\/td>\n<\/tr>\n
Size<\/span><\/td>\n51.4cm long<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

The short-coherence source, full-axis optical design and 4D\u2019s patented dynamic interferometry combine to allow you to isolate and measure individual surfaces in complex optical systems. Perform tests at cavity distance, and even measurements in vacuum or controlled atmosphere chambers.<\/span>\u00a0<\/span><\/p>\n

AccuFiz D<\/strong> eliminates the need for slow, vibration-sensitive phase shifting. Its patented high-speed, single-camera phase sensor performs a full wavefront measurement in just 150 microseconds. With such a short acquisition time, the system can be used in almost any condition, even for measuring moving parts without vibration isolation.<\/span>\u00a0<\/span><\/p>\n

The AccuFiz D<\/strong> is fully axis-based, meaning that the reference and test beams follow nominally identical trajectories through the imaging optics of the instrument. Therefore, aberrations and thickness variations in the internal optics of the system cancel each other. The result: very precise measurements, even on non-spherical domes and other curved surfaces.<\/span>\u00a0<\/span><\/p>\n

The AccuFiz D dynamic is vibration-insensitive, so it can operate in environments where other instruments simply cannot. The AccuFiz D can therefore be used directly in the workshop to measure:<\/span>\u00a0<\/span><\/p>\n