Call
Request a call

    Contact

    Metrology of 3D surfaces

    • OptoScan 600

      Measurements of the roughness and waviness of the total surface area of semiconductor panels

      Measurements of the roughness and waviness of the total surface area of semiconductor panels

    • OptoSphere

      Hip prosthesis head measuring machine

      Hip prosthesis head measuring machine

    • 4D InSpec XL

      Wide field of view (15x15mm)

      Wide field of view (15x15mm)

    • 4D SurfSpec

      Inspection of coated or painted surfaces

      Inspection of coated or painted surfaces

    • OptoBot

      Measurements carried out via a robot

      Measurements carried out via a robot

    • OptoGloss

      Measurement of roughness and gloss of coated surfaces

      Measurement of roughness and gloss of coated surfaces

    • OptoRack

      Rack and Axle Steering Measuring Device

      Rack and Axle Steering Measuring Device

    • OptoSurf OS 500 LINEAR Sensor

      Sensor integrated on the production line

      Sensor integrated on the production line

    • OptoWorm

      Measuring device for electric worm EPS Worms

      Measuring device for electric worm EPS Worms

    • Software InSpec

      Data analysis software

      Data analysis software

    • WaferMaster

      Special measuring device for measuring silicon wafers

      Special measuring device for measuring silicon wafers
    1 2
    English