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Metrology of 3D surfaces

  • OptoScan 600

    Measurements of the roughness and waviness of the total surface area of semiconductor panels

    Measurements of the roughness and waviness of the total surface area of semiconductor panels
  • OptoSphere

    Hip prosthesis head measuring machine

    Hip prosthesis head measuring machine
  • 4D InSpec XL

    Wide field of view (15x15mm)

    Wide field of view (15x15mm)
  • 4D SurfSpec

    Inspection of coated or painted surfaces

    Inspection of coated or painted surfaces
  • OptoBot

    Measurements carried out via a robot

    Measurements carried out via a robot
  • OptoGloss

    Measurement of roughness and gloss of coated surfaces

    Measurement of roughness and gloss of coated surfaces
  • OptoRack

    Rack and Axle Steering Measuring Device

    Rack and Axle Steering Measuring Device
  • OptoSurf OS 500 LINEAR Sensor

    Sensor integrated on the production line

    Sensor integrated on the production line
  • OptoWorm

    Measuring device for electric worm EPS Worms

    Measuring device for electric worm EPS Worms
  • Software InSpec

    Data analysis software

    Data analysis software
  • WaferMaster

    Special measuring device for measuring silicon wafers

    Special measuring device for measuring silicon wafers
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