OptiSurf® is a range of instruments ideal for non-contact measurement of optical thicknesses of plates, lenses, objectives, waveguides, or complex optical sub-assemblies. These instruments are based on the principle of Low Coherence Interferometry, and can measure any distance between surfaces in an optical system with micrometric precision. The OptiSurf® LTM version is designed to measure the thickness of single, doublet or triplet lenses. The Optisurf® PRO version is designed to measure waveguide thicknesses.
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OptiSurf PRO AR
OptiSurf PRO AR is a measuring station for characterizing the geometric properties of single waveguides and other planar optical elements as well as waveguide stacks. The […]
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OptiSurf
Integrated version on OptiCentric
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OptiSurf LTM
Stand-alone thickness station