LM 20/50 interferometric probe

Highly linear fiber-coupled probe for high-precision tactile thickness measurement and calibration:

• Precision laser interferometric probe for tactile length/thickness measurements
• Linearity ≤ ±2 nm
• Adjustable fixed measuring force 0.5 … 1.5 N
• High linearity over entire measuring range
• Constant probe force over the entire measuring range
• Open interfaces for OEM software under Windows and Linux
• LM Series laser interferometric probes are precision linear encoders. They enable tactile measurements over a 20 or 50 mm measuring range with nanometer accuracy. Thanks to their size and the Ø 8 mm h6 clamping shaft diameter, these highly linear measuring probes are compatible with conventional measuring systems.
• The integrated laser interferometer converts the measuring movement of the motorized measuring pins into an interference signal. This optical measurement signal is transmitted via fiber optics to the optoelectronic power supply and evaluation unit, and output as a length value. The stylus tip and the integrated interferometer are adjusted to each other, taking into account the minimization of abbe and alignment errors.

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