OptiSurf PRO AR

OptiSurf PRO AR is a measuring station for characterizing the geometric properties of single waveguides and other planar optical elements as well as waveguide stacks. The “stacks” waveguides consist of two or three elements and their inclination can cause chromatic errors. The PRO AR allows to measure the inclination between different layers or with respect to a mechanical reference. We can also measure the total thickness variation (TTV) on the waveguide surface, this variation being critical for the contrast (MTF) of the generated image. 

Whether you are in the manufacturing, research or quality control of waveguide stacks or optical elements, our system accurately measures individual center thickness and air plates between components with sub-micron accuracy. It also analyzes the inclination, shape of the surface and its curvature directly in the software. 

Factors affecting image quality: 

• Non-uniform thickness of the sample
• Air gap/ glue thickness
• Inclination of the layers
• Internal curvature of stacked layers