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WaveMaster Compact wavefront analyzer
The WaveMaster compact is a turnkey bench for measuring optical systems in reflection or transmission using a TRIOPTICS Shack-Hartmann wavefront analyzer.
In this way, it is possible to measure the wavefront but also the surface topography of flat, spherical or aspherical optics with a single system, with simple adjustments.
Features of the WaveMaster Compact optical wave front analysis system:
| TRANSMISSION | |
| Configuration | – Wavefront measurement
– Transmission |
| Sample diameter | 0.5 mm à 14mm |
| Focal length of sample | -30 à +100mm |
| Wavelength | 365nm – 1064nm |
| Wave front measurement accuracy | < λ/20 (RMS) |
| Repeatability | < λ/200 (RMS) |
| Dynamic | > 2000 λ |
| Frequency of measurement | Jusqu’à 12Hz |
| Lateral resolution | 138*138 |
| Reflection | |
| Configuration | – Surface topography
– Curvature radius measurement – Reflection |
| Sample diameter | 0.5 mm à 18mm |
| Focal length of sample | -50 à +30mm |
| Wavelength | 365nm – 635nm |
| Profile measurement accuracy | < 0.050 µm (RMS) |
| Repeatability | < 0.005 µm (RMS) |
| Dynamic | > 200 λ |
| Maximum asphericity of sample | ≤ 7° |
| Frequency of measurement | Jusqu’à 12Hz |
| Lateral resolution | 138*138 |
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