Advanced glass analysis using LIBS technique

During the glass manufacturing process, impurities such as nickel (Ni) and sulfur (S) may unintentionally become incorporated into the material. When combined, these two elements can form NiS inclusions in the glass, which appear as black defects. This not only reduces the transparency of the material but also introduces non-homogeneity that may compromise its mechanical strength. Implementing quality control measures in the glass manufacturing process is therefore essential to ensure compliance with the highest standards of quality and durability.

Using the LIBS technique, we achieve precise detection by relying solely on the red/IR spectral region. When measurements are performed under an argon atmosphere, sensitivity is further enhanced through the intensification of sulfur (S) signals. LIBS therefore stands out as a superior alternative to SEM, offering a fast, cost-effective, and reliable solution for detecting these impurities. At a fraction of the investment and operating costs, LIBS delivers results 40 times faster while increasing throughput.